Hanke Larry D. Handbook of Analytical Methods for Materials

MEE. 2001. 50 p.Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (Auger)
Energy Dispersive X-ray Spectroscopy (EDS)
Fourier Transform-infrared Spectroscopy (FTIR)
Gas Chromatography / Mass Spectroscopy (GC-MS)
Ion Chromatography (IC)
Light Microscopy (LM)
Metallographic Study
Microindentation Hardness Testing
Nanoindentation Hardness Testing
Quantitative Chemical Analysis
Rockwell Hardness Testing
Scanning Electron Microscopy (SEM)
Secondary Ion Mass Spectrometry (SIMS)
Thermal Analysis (DSC, TGA)
X-ray Photoelectron Spectroscopy (XPS or ESCA)
Sample Preservation And Handling
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